Accelerator based materials physics
The activity of the accelerator based materials physics group is directed towards the use of accelerated particles and radiation for characterizing and modification of materials on a scale of nanometres.
The main areas of current activity are:
- Application of ion beams for elemental depth profiling of thin films and different materials
- Research and development of time-of-flight detectors and energy detectors for MeV ion ranges
- Deposition of functional thin films using atomic layer deposition
- Helium ion microscopy
The key instrument of the group is 1.7 MV Pelletron accelerator which was donated by Technical Research Centre of Finland in 2006. It is actively used for ion beam analysis and ion beam lithography. At the present the available energy range starts from <200 keV for H, He and O, and goes up close to 15 MeV for multiply charged heavy ions ions. We currently have 4 active beam-lines; one for Rutherford Backscattering Spectrometry (RBS), a short beam line for particle induced X-ray emission (PIXE) studies together with RBS, one for ion beam lithography and the newest is the ToF-ERDA beamline. The ToF-ERDA analysis software Potku is also developed by the group.
One of the main aims of the group is to act as a bridge between the Nanoscience Centre at the University of Jyväskylä and the Accelerator Laboratory. In particular we are reaching out towards using the JYFL cyclotrons for new applications in biomedical and chemical research. A key part of the work of the group is train of students on applications of accelerators in materials science and technology. This is done by supervising of masters projects and course work.