Bruker Dimension Icon AFM

Back to the list

Bruker Dimension Icon Atomic Force Microscope (AFM)


Bruker Dimension Icon AFM device. (Picture taken by Saku Mattila.)

Name and Model (Year of Manufacture / Installation)

Bruker Dimension Icon (2016/2016)

General Information

Atomic force microscope (AFM).  

Key Specifications

X-Y scan range (typical): 90 μm x 90 μm, Z-range (typical): 10 μm

Sample size/holder: 210mm vacuum chuck for samples, ≤210mm diameter, ≤15mm thick

High-pixel-density images: 5120 x 5120
Vertical noise: < 35 pm

Closed loop operation
Integral non-linearity usually < 0,5 %
Drift rates less than 200 pm per minute render distortion-free images immediately.

Temperature-compensating position sensors.
NanoScope V controller.

Key Features

AFM basic modes (in air & liquid unless stated differently):

  • Scan Asyst
  • Peak Force Tapping (PFT)
  • Tapping Mode
  • Contact Mode
  • Lateral Force Microscopy (LFM)
  • Phase Imaging
  • Lift Mode
  • Magnetic Force Microscopy (MFM)
  • Force Spectroscopy
  • Force Volume
  • Electron Force Microscopy (EFM) (in air)
  • Surface Potential
  • Piezoresponse Microscopy

Application modules:

  • ScanAsyst automated imaging.
  • PeakForce Quantitative nanoscale material (PF-QNM) property mapping
  • PeakForce Capture (High-Sensitivity Nanomechanical Data at Every Pixel)
  • PeakForce Tunnelling AFM (PF-TUNA)
  • PeakForce Kelvin Probe Force Microscopy (PF-KPFM)


  • 5-megapixel digital camera
  • 180 µm to 1465 µm viewing area
  • Digital zoom and motorized focus
Location, Responsible Person

Nanoscience Center, YN 040.2 / Kimmo Kinnunen,