10.03.2016

Bruker Dimension Icon AFM

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Bruker Dimension Icon Atomic Force Microscope (AFM)

 Dimicon.jpg

Bruker Dimension Icon AFM device. (Picture taken by Saku Mattila.)

Name and Model (Year of Manufacture / Installation)

Bruker Dimension Icon (2016/2016)

General Information

Atomic force microscope (AFM).  

Key Specifications

X-Y scan range (typical): 90 μm x 90 μm, Z-range (typical): 10 μm

Sample size/holder: 210mm vacuum chuck for samples, ≤210mm diameter, ≤15mm thick

High-pixel-density images: 5120 x 5120
Vertical noise: < 35 pm

Closed loop operation
Integral non-linearity usually < 0,5 %
Drift rates less than 200 pm per minute render distortion-free images immediately.

Temperature-compensating position sensors.
NanoScope V controller.

Key Features

AFM basic modes (in air & liquid unless stated differently):

  • Scan Asyst
  • Peak Force Tapping (PFT)
  • Tapping Mode
  • Contact Mode
  • Lateral Force Microscopy (LFM)
  • Phase Imaging
  • Lift Mode
  • Magnetic Force Microscopy (MFM)
  • Force Spectroscopy
  • Force Volume
  • Electron Force Microscopy (EFM) (in air)
  • Surface Potential
  • Piezoresponse Microscopy

Application modules:

  • ScanAsyst automated imaging.
  • PeakForce Quantitative nanoscale material (PF-QNM) property mapping
  • PeakForce Capture (High-Sensitivity Nanomechanical Data at Every Pixel)
  • PeakForce Tunnelling AFM (PF-TUNA)
  • PeakForce Kelvin Probe Force Microscopy (PF-KPFM)

Optics:

  • 5-megapixel digital camera
  • 180 µm to 1465 µm viewing area
  • Digital zoom and motorized focus
Location, Responsible Person

Nanoscience Center, YN 040.2 / Kimmo Kinnunen,