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PSIA XE-100 Atomic Force Microscope (AFM)

PSIAXE100.jpg (Picture taken by Saku Mattila.)

Name and Model (Year of Manufacture / Installation)

PSIA XE-100 (2005/2005)

General Information

Atomic force microscope (AFM). Imaging in tapping mode.

Key Specifications

Maximum sample size: up to 100 mm x 100 mm x 20 mm
Maximum sample mass: 500 g
X-Y scan size: 100 µm x 100 µm
Z measurement range: 12 µm

Key Features

 Several AFM modes:

  • Non-contact mode AFM
  • Contact mode AFM
  • Tapping mode AFM
  • Lateral Force Microscopy (LFM)
  • Force vs. distance curve

Other features:

  • Environmental chamber, which allows control of humidity and pressure. Also imaging in different gases is possible.
  • Calibrated x, y and z scales.
  • Separated xy and z scanners to eliminate crosstalk and non-linearity.
  • Active vibration isolation.
Location, Responsible Person

  Nanoscience Center, YN 112.1 / Kimmo Kinnunen