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15.08.2018

Available cocktails in RADEF

In the table below are the experimental values for the LET of RADEF ions in silicon targets, as well as corresponding estimates from the SRIM-2003.26 code for comparison. The LET values for these same ions but different energies can be calculated using the semi-empirical estimations based on the classical Bohr theory for electronic stopping. More details on the estimation process are to be published.

Ion Energy
[MeV]		 LETMEAS
@surface
[MeV/mg/cm2]		 LETMEAS
@Bragg peak
[MeV/mg/cm2]		 LETSRIM
@surface
[MeV/mg/cm2]		 RangeSRIM
[microns]		 LETSRIM
@Bragg peak
[MeV/mg/cm2]
15N+4 139 1.87 5.92 (@191 um) 1.83 202 5.9 (@198 um)
20Ne+6 ‡ 186 3.68 9.41 (@138 um) 3.63 146 9.0 (@139 um)
30Si+8 278 6.74 13.7 (@114 um) 6.40 130 14.0 (@120 um)
40Ar+12 ‡ 372 10.08 18.9 (@100 um) 10.2 118 19.6 (@105 um)
56Fe+15 523 18.84 29.7 (@75 um) 18.5 97 29.3 (@77 um)
82Kr+22 768 30.44 41.7 (@68 um) 32.2 94 41.0 (@69 um)
131Xe+35 1217 54.95 67.9 (@57 um) 60.0* 89* 69.2 (@48 um)
Table 1. 9.3 MeV/amu cocktails (M/Q≈3.7, ‡M/Q≈3.3). 
*Estimated values for 1.22GeV Xenon in Silicon.


NOTE. Mass-to-charge ratio of 20Ne+6 and 40Ar+12 differs from that of the other ions in the high penetration cocktail. Due to this difference we recommend to use these two elements sequentially (if possible), thus sparing time otherwise spent tuning the beam line.

Ion species in Table 1 can also be delivered at lower energies (i.e. down to 4 MeV/amu) at request. Thus different LET and range values are obtained. Changing the beam species to an ion with a different mass-to-charge ratio takes 4 hours on average.