Research interests in our research group

The group specializes in applied research around nuclear- and accelerator-based technology and operates the  Radiation Effects Facility, RADEF, for the studies of radiation effects in electronics and related materials. RADEF officially became an ESA-supported European Component Irradiation Facility (ECIF) in 2005 [ESA/ESTEC Contracts No.18197/04/NL/CP and 4000111630/14/NL/PA]. Since then the group has carried out irradiation tests not only for ESA and the European space industry, but also for other world leading space organizations (e.g. NASAJAXACNES), companies and universities. 

RADEF’s specialty is to provide high penetration heavy ion cocktail beams, protons in wide energy range and energetic electrons. For these the RADEF group utilizes combination of JYFL's ECR ion sources and K-130 cyclotron, and the LINAC electron accelerator. Because the emerging technologies make integrated circuits more susceptible to radiation, the group is expanding its research activities toward the radiation effects in avionics and ground level systems.

Selected publications

Tali, M., Alía, R. G., Brugger, M., Ferlet-Cavrois, V., Corsini, R., Farabolini, W., . . . Virtanen, A. Mechanisms of Electron-Induced Single Event LatchupIEEE Transactions on Nuclear Science, 66 (1), 437-443 (2019). doi:10.1109/TNS.2018.2884537


Javanainen, A., Muinos, H. V., Nordlund, K., Galloway, K. F., Turowski, M., & Schrimpf, R. D. Molecular dynamics simulations of heavy ion induced defects in SiC Schottky diodesIEEE Transactions on Device and Materials Reliability, 18 (3), 481-483 (2018). doi:10.1109/TDMR.2018.2842253 Open access


Bagatin, M., Gerardin, S., Paccagnella, A., Visconti, A., Virtanen, A., Kettunen, H., . . . Zadeh, A. Single Event Upsets Induced by Direct Ionization from Low-Energy Protons in Floating Gate CellsIEEE Transactions on Nuclear Science, 64 (1), 464-470 (2017). doi:10.1109/TNS.2016.2637571 Open access