Kimmo Niskanen

Publication

2026

Impact of Proton Irradiation on the TDDB Reliability of SiC MOSFETs

International Symposium for Testing and Failure Analysis. ASM International.

Coq Germanicus, Rosine

Niskanen, Kimmo

Phulpin, Tangu

Dherbecourt, Pascal

Moultif, Niemat

Bascoul, Guillaume

Publication

2026

OFF-State Leakage Degradation Induced by Heavy-Ion Irradiation in Schottky p-GaN Gate HEMTs

IEEE Access.

Tallarico, A. N.

Niskanen, K.

Volosov, V.

Millesimo, M.

Fiegna, C.

Publication

2026

Temperature Effect on Single Event Burnout and Leakage Current in SiC Power MOSFETs

IEEE Transactions on Nuclear Science.

Niskanen, K.

Martinella, C.

Witulski A., F.

Kettunen, H.

Javanainen, A.

Publication

2025

Effects of Incident Angle on Single-Event Leakage Current Degradation in Heavy-Ion Irradiated 1800 V and 4500 V SiC Power MOSFETs

IEEE Transactions on Nuclear Science.

Sengupta, A.

Martinella, C.

Ball, D. R.

Niskanen, K.

Senarath, A. S.

Islam, S.

Harris, P. M.

Hutson, J. M.

Osheroff, J. M.

Sternberg, A. L.

Kettunen, H.

Kosier, S. L.

Grossner, U.

Javanainen, A.

Galloway, K. F.

Schrimpf, R. D.

Witulski, A. F.

Publication

2025

Gate Current Stress for Detecting Neutron-Induced Degradation in SiC Power MOSFETs

IEEE International Reliability Physics Symposium.

Niskanen, K.

Javanainen, A.

Kettunen, H.

Cazzaniga, C.

Kastriotou, M.

Frost, C.

Publication

2025

Proton Energy Dependence of SiC Power MOSFET Single Event Burnout Sensitivity

IEEE Transactions on Nuclear Science.

Niskanen, K.

Javanainen, A.

Martinella, C.

Hajdas, W.

Grossner, U.

Kettunen, H.

Publication

2025

Single Event Effects of SiC power MOSFETs : from neutron interaction to destruction at the die level

IEEE Transactions on Nuclear Science.

Germanicus, Rosine Coq

Michez, Alain

Niskanen, Kimmo

Chaudhary, Mahima

Bascoul, Guillaume

Chazal, Vanessa

Wrobel, Frederic

Boch, Jerome

Publication

2025

Temperature Dependence of Heavy Ion Induced Leakage Current in SiC Power MOSFETs

IEEE Transactions on Nuclear Science.

Niskanen, K.

Martinella, C.

Sengupta, A.

Harris, P. M.

Witulski, A. F.

Kettunen, H.

Javanainen, A.

Publication

2024

AFM-sMIM Characterization of the Recombination-Enhancing Buffer Layer for Bipolar Degradation Free SiC MOSFETs

Solid State Phenomena.

Germanicus, Rosine Coq

Phulpin, Tanguy

Niskanen, Kimmo

Michez, Alain

Lüders, Ulrike

Publication

2024

SiC MOSFET structure at the die level with AFM sMIM Mode

IEEE Workshop on Wide Bandgap Power Devices & Applications. ... IEEE Workshop on Wide Bandgap Power Devices and Applications.

Coq Germanicus, Rosine

Chaudhary, Mahima

Niskanen, Kimmo

Larose, Xavier

Chazal, Vanessa

Bascoul, Guillaume

Publications

Impact of Proton Irradiation on the TDDB Reliability of SiC MOSFETs

OFF-State Leakage Degradation Induced by Heavy-Ion Irradiation in Schottky p-GaN Gate HEMTs

Temperature Effect on Single Event Burnout and Leakage Current in SiC Power MOSFETs

Effects of Incident Angle on Single-Event Leakage Current Degradation in Heavy-Ion Irradiated 1800 V and 4500 V SiC Power MOSFETs

Gate Current Stress for Detecting Neutron-Induced Degradation in SiC Power MOSFETs

Proton Energy Dependence of SiC Power MOSFET Single Event Burnout Sensitivity

Single Event Effects of SiC power MOSFETs : from neutron interaction to destruction at the die level

Temperature Dependence of Heavy Ion Induced Leakage Current in SiC Power MOSFETs

AFM-sMIM Characterization of the Recombination-Enhancing Buffer Layer for Bipolar Degradation Free SiC MOSFETs

SiC MOSFET structure at the die level with AFM sMIM Mode

Radiation Effects and Industrial Applications